"TAM Design and Optimization for Transparency-Based SoC Test."

Tomokazu Yoneda et al. (2007)

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DOI: 10.1109/VTS.2007.78

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Tomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara:
TAM Design and Optimization for Transparency-Based SoC Test. VTS 2007: 381-388

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