"Efficient Test Generation for Transient Testing of Analog Circuits Using ..."

Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee (1999)

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DOI: 10.1109/VTEST.1999.766668

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee:
Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation. VTS 1999: 214-219

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