"Circuit-level classification and testability analysis for CMOS faults."

Scott F. Midkiff, S. Wayne Bollinger (1991)

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DOI: 10.1109/VTEST.1991.208157

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Scott F. Midkiff, S. Wayne Bollinger:
Circuit-level classification and testability analysis for CMOS faults. VTS 1991: 193-198

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