"Soft-Error Hardening Designs of Nanoscale CMOS Latches."

Sheng Lin, Yong-Bin Kim, Fabrizio Lombardi (2009)

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DOI: 10.1109/VTS.2009.10

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sheng Lin, Yong-Bin Kim, Fabrizio Lombardi:
Soft-Error Hardening Designs of Nanoscale CMOS Latches. VTS 2009: 41-46

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