"Low-cost diagnosis of defects in MCM substrate interconnections."

Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan (1996)

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DOI: 10.1109/VTEST.1996.510866

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan:
Low-cost diagnosis of defects in MCM substrate interconnections. VTS 1996: 260-265

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