"MBIST and statistical hypothesis test for time dependent dielectric ..."

Woongrae Kim et al. (2015)

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DOI: 10.1109/VTS.2015.7116289

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Woongrae Kim, Chang-Chih Chen, Soonyoung Cha, Linda Milor:
MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array. VTS 2015: 1-6

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