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"Fast Test Generation for Structurally Similar Circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Jerin Joe et al. (2022)

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DOI: 10.1109/VTS52500.2021.9794232

access: closed

type: Conference or Workshop Paper

metadata version: 2025-09-06

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  dblp key:
  - conf/vts/JoeMPR22
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  persistent URL:
  - https://dblp.org/rec/conf/vts/JoeMPR22
Jerin Joe, Nilanjan Mukherjee, Irith Pomeranz, Janusz Rajski:
Fast Test Generation for Structurally Similar Circuits. VTS 2022: 1-7

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