"Fault modeling and testing of self-timed circuits."

Stanford S. Guillory, Daniel G. Saab, Andrew T. Yang (1991)

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DOI: 10.1109/VTEST.1991.208134

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/GuillorySY91
Stanford S. Guillory, Daniel G. Saab, Andrew T. Yang:
Fault modeling and testing of self-timed circuits. VTS 1991: 62-66

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