"Pinhole Latent Defect Modeling and Simulation for Defect-Oriented ..."

Jhon Gomez et al. (2020)

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DOI: 10.1109/VTS48691.2020.9107625

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-01

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Jhon Gomez, Nektar Xama, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Georges G. E. Gielen:
Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing. VTS 2020: 1-6

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