"Scalable Compact Test Pattern Generation for Path Delay Faults Based on ..."

Edward Flanigan, Spyros Tragoudas, Arkan Abdulrahman (2009)

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DOI: 10.1109/VTS.2009.22

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Edward Flanigan, Spyros Tragoudas, Arkan Abdulrahman:
Scalable Compact Test Pattern Generation for Path Delay Faults Based on Functions. VTS 2009: 140-145

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