"Cyclic stress tests for full scan circuits."

Vinay Dabholkar et al. (1995)

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DOI: 10.1109/VTEST.1995.512622

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel:
Cyclic stress tests for full scan circuits. VTS 1995: 89-94

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