"Test Set Reordering Using the Gate Exhaustive Test Metric."

Kyoung Youn Cho, Edward J. McCluskey (2007)

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DOI: 10.1109/VTS.2007.79

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kyoung Youn Cho, Edward J. McCluskey:
Test Set Reordering Using the Gate Exhaustive Test Metric. VTS 2007: 199-204

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