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"Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for ..."
Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu (2001)
- Kuo-Liang Cheng, Ming-Fu Tsai, Cheng-Wen Wu:

Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories. VTS 2001: 225-230

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