"Scan Chain Reordering for Improving Test Coverage with Compression."

Hairui Cai et al. (2026)

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DOI: 10.1109/VTS69484.2026.11563332

access: closed

type: Conference or Workshop Paper

metadata version: 2026-06-24

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Hairui Cai, Zezhong Wang, Yu Huang, Naixing Wang, Zhouxing Su, Zhipeng Lv:
Scan Chain Reordering for Improving Test Coverage with Compression. VTS 2026: 1-7

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