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"H-SCAN: A high level alternative to full-scan testing with reduced area ..."
Subhrajit Bhattacharya, Sujit Dey (1996)
- Subhrajit Bhattacharya, Sujit Dey:

H-SCAN: A high level alternative to full-scan testing with reduced area and test application overheads. VTS 1996: 74-80

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