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"Yield-Reliability Modeling: Experimental Verification and Application to ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Thomas S. Barnett et al. (2002)

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DOI: 10.1109/VTS.2002.1011114

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/BarnettSGP02
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  persistent URL:
  - https://dblp.org/rec/conf/vts/BarnettSGP02
Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy:
Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction. VTS 2002: 75-80

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