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"An efficient test data reduction technique through dynamic pattern mixing ..."
Srinivasulu Alampally et al. (2011)
- Srinivasulu Alampally, R. T. Venkatesh, Priyadharshini Shanmugasundaram, Rubin A. Parekhji, Vishwani D. Agrawal:

An efficient test data reduction technique through dynamic pattern mixing across multiple fault models. VTS 2011: 285-290

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