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"Transistor Self-Heating: The Rising Challenge for Semiconductor Testing."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Om Prakash et al. (2021)

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DOI: 10.1109/VTS50974.2021.9441002

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/vts/0007DCA21
Om Prakash, Chetan K. Dabhi, Yogesh Singh Chauhan, Hussam Amrouch:
Transistor Self-Heating: The Rising Challenge for Semiconductor Testing. VTS 2021: 1-7

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