"Determining the low-frequency noise source in cryogenic operation of ..."

Takumi Inaba et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185298

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-28

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Takumi Inaba, Hiroshi Oka, Hidehiro Asai, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Koichi Fukuda, Takahiro Mori:
Determining the low-frequency noise source in cryogenic operation of short-channel bulk MOSFETs. VLSI Technology and Circuits 2023: 1-2

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