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"Comprehensive Analysis of Duty-Cycle Induced Degradations in ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Guan Feng et al. (2024)

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DOI: 10.1109/VLSITECHNOLOGYANDCIR46783.2024.10631494

access: closed

type: Conference or Workshop Paper

metadata version: 2026-07-16

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Guan Feng, Yu Li, Hao Jiang, Xiaodong Wang, Yize Sun, Yingfen Wei, Qi Liu, Ming Liu:
Comprehensive Analysis of Duty-Cycle Induced Degradations in HfxZr1-xO2-Based Ferroelectric Capacitors: Behavior, Modeling, and Optimization. VLSI Technology and Circuits 2024: 1-2

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