"Functional test generation for non-scan sequential circuits."

Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal (1995)

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DOI: 10.1109/ICVD.1995.512076

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Mandyam-Komar Srinivas, James Jacob, Vishwani D. Agrawal:
Functional test generation for non-scan sequential circuits. VLSI Design 1995: 47-52

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