"End-to-End Optimization of Polarimetric Measurement and Material Classifier."

Ryota Maeda et al. (2026)

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DOI: 10.5220/0014325900004084

access: closed

type: Conference or Workshop Paper

metadata version: 2026-04-22

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  dblp key:
  - conf/visapp/MaedaANH26
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  - https://dblp.org/rec/conf/visapp/MaedaANH26
Ryota Maeda, Naoki Arikawa, Yutaka No, Shinsaku Hiura:
End-to-End Optimization of Polarimetric Measurement and Material Classifier. VISAPP (2) 2026: 550-559

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