"U-Net based Zero-hour Defect Inspection of Electronic Components and ..."

Florian Kälber et al. (2021)

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DOI: 10.5220/0010320205930601

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-02

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Florian Kälber, Okan Köpüklü, Nicolas H. Lehment, Gerhard Rigoll:
U-Net based Zero-hour Defect Inspection of Electronic Components and Semiconductors. VISIGRAPP (5: VISAPP) 2021: 593-601

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