"Unveiling the Impact of Interface Traps Induced on Negative Capacitance ..."

Aniket Gupta et al. (2022)

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DOI: 10.1007/978-3-031-21514-8_8

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-19

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  - conf/vdat/GuptaBBBDBC22
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Aniket Gupta, Govind Bajpai, Navjeet Bagga, Shashank Banchhor, Sudeb Dasgupta, Anand Bulusu, Nitanshu Chauhan:
Unveiling the Impact of Interface Traps Induced on Negative Capacitance Nanosheet FET: A Reliability Perspective. VDAT 2022: 85-96

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