"An effective test methodology enabling detection of weak bits in SRAMs: ..."

Nidhi Batra et al. (2016)

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DOI: 10.1109/ISVDAT.2016.8064868

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-25

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Nidhi Batra, Anil Kumar Gundu, Mohammad S. Hashmi, G. S. Visweswaran, Anuj Grover:
An effective test methodology enabling detection of weak bits in SRAMs: Case study in 28nm FDSOI. VDAT 2016: 1-6

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