"VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, ..."

Ambika Prasad Shah et al. (2022)

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DOI: 10.1007/978-3-031-21514-8

access: closed

type: Editorship

metadata version: 2022-12-19

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Ambika Prasad Shah, Sudeb Dasgupta, Anand D. Darji, Jaynarayan T. Tudu:
VLSI Design and Test - 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers. Communications in Computer and Information Science 1687, Springer 2022, ISBN 978-3-031-21513-1 [contents]

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