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"Fault-based product-line testing: effective sample generation based on ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Dennis Reuling et al. (2015)

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DOI: 10.1145/2791060.2791074

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
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Dennis Reuling, Johannes Bürdek, Serge Rotärmel, Malte Lochau, Udo Kelter:
Fault-based product-line testing: effective sample generation based on feature-diagram mutation. SPLC 2015: 131-140

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