"Hybrid AI-Optimization Method for Latent Defect Detection Through Test ..."

Sankhya Bhattacharya, Georges G. E. Gielen (2025)

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DOI: 10.1109/SMACD65553.2025.11092178

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type: Conference or Workshop Paper

metadata version: 2025-09-06

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Sankhya Bhattacharya, Georges G. E. Gielen:
Hybrid AI-Optimization Method for Latent Defect Detection Through Test Transistor Insertion in Analog Circuits. SMACD 2025: 1-4

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