"Test patterns for IoT."

Pedro Martins Pontes, Bruno Lima, João Pascoal Faria (2018)

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DOI: 10.1145/3278186.3278196

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-25

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Pedro Martins Pontes, Bruno Lima, João Pascoal Faria:
Test patterns for IoT. A-TEST@ESEC/SIGSOFT FSE 2018: 63-66

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