"A new methodology for providing insight into manufacturing using KPIs ..."

Mitsushiro Fujishima et al. (2020)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2020-11-10

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Mitsushiro Fujishima, Shinobu Ueda, Hisato Yoneda, Takashi Yoshizawa, Akio Ito, Tetsuo Takeuchi, Shinichiro Chino, Kenji Kitayama, Toshio Ono, Takashi Matsukuma, Hiroshi Yoshida, Makoto Okuda, Kenji Kumagai:
A new methodology for providing insight into manufacturing using KPIs based on SMKL (Smart Manufacturing Kaizen Level), utilizing industry standards (OPC UA, FDT, PLCopen and AutomationML). SICE 2020: 1-6

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