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"Test Pattern Generation Effort Evaluation of Reversible Circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Abhoy Kole et al. (2017)

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DOI: 10.1007/978-3-319-59936-6_13

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-26

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/rc/KoleWD017
Abhoy Kole, Robert Wille, Kamalika Datta, Indranil Sengupta:
Test Pattern Generation Effort Evaluation of Reversible Circuits. RC 2017: 162-175

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