"Patterns that Break Memory: SEU Characterization of COTS LPDDR2 and LPDDR4 ..."

Saad Memon et al. (2025)

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DOI: 10.1109/QRS65678.2025.00053

access: closed

type: Conference or Workshop Paper

metadata version: 2026-04-22

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Saad Memon, Rafal Graczyk, Tomasz Rajkowski, Jan Swakon, Mike Papadakis:
Patterns that Break Memory: SEU Characterization of COTS LPDDR2 and LPDDR4 SDRAM via Stress Testing Under 60 MeV Proton Beam. QRS 2025: 462-472

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