"On-Chip Delay Measurement for In-Field Test of FPGAs."

Yousuke Miyake, Yasuo Sato, Seiji Kajihara (2019)

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DOI: 10.1109/PRDC47002.2019.00043

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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Yousuke Miyake, Yasuo Sato, Seiji Kajihara:
On-Chip Delay Measurement for In-Field Test of FPGAs. PRDC 2019: 130-137

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