"FINE Samples for Learning with Noisy Labels."

Taehyeon Kim et al. (2021)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2024-11-04

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Taehyeon Kim, Jongwoo Ko, Sangwook Cho, Jinhwan Choi, Se-Young Yun:
FINE Samples for Learning with Noisy Labels. NeurIPS 2021: 24137-24149

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