"Line defect detection on 2D materials with micro four-point probe measurement."

Xu Gong, Fei Wang (2015)

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DOI: 10.1109/NEMS.2015.7147498

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Xu Gong, Fei Wang:
Line defect detection on 2D materials with micro four-point probe measurement. NEMS 2015: 589-592

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