"Measurement System for Characterization of a Resistor Array in 180-nm CMOS ..."

Ivana Frankovic et al. (2023)

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DOI: 10.23919/MIPRO57284.2023.10159949

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Ivana Frankovic, Franjo Mikic, Josip Mikulic, Niko Bako, Gregor Schatzberger, Adrijan Baric:
Measurement System for Characterization of a Resistor Array in 180-nm CMOS Technology. MIPRO 2023: 202-207

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