"Adversarially Fine-Tuned Self-supervised Framework for Automated Landmark ..."

Anirvan Krishna, Zaid Ahmed Khan (2025)

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DOI: 10.1007/978-3-032-11616-1_5

access: closed

type: Conference or Workshop Paper

metadata version: 2026-02-01

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Anirvan Krishna, Zaid Ahmed Khan:
Adversarially Fine-Tuned Self-supervised Framework for Automated Landmark Detection in Intrapartum Ultrasound. IUGC@MICCAI 2025: 47-61

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