"Test compression for circuits with multiple scan chains."

Ondrej Novák, Jiri Jenícek, Martin Rozkovec (2015)

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DOI: 10.1109/LATW.2015.7102510

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Ondrej Novák, Jiri Jenícek, Martin Rozkovec:
Test compression for circuits with multiple scan chains. LATS 2015: 1-6

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