"Extraction of Measurement Device Information on an ESP32 Microcontroller: ..."

Jonas Paul et al. (2024)

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DOI: 10.1016/J.PROCS.2024.09.670

access: open

type: Conference or Workshop Paper

metadata version: 2025-11-02

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Jonas Paul, Lukas Schmid, Marco Klaiber, Manfred Rössle:
Extraction of Measurement Device Information on an ESP32 Microcontroller: TinyML for Image Processing. KES 2024: 2002-2011

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