"Learning from artifacts: metadata utilization analysis."

William E. Moen et al. (2006)

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DOI: 10.1145/1141753.1141813

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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William E. Moen, Shawne D. Miksa, Amy Eklund, Serhiy Polyakov, Gregory Snyder:
Learning from artifacts: metadata utilization analysis. JCDL 2006: 270-271

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