"A Novel Approach for Patent Similarity Measurement Based on Sequence ..."

Xin An et al. (2020)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2025-03-12

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  dblp key:
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Xin An, Jinghong Li, Shuo Xu, Liang Chen, Sainan Pi:
A Novel Approach for Patent Similarity Measurement Based on Sequence Alignment. EEKE@JCDL 2020: 45-49

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