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"IEEE 1500 utilization in SOC design and test."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Yervant Zorian, Avetik Yessayan (2005)

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DOI: 10.1109/TEST.2005.1584015

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/ZorianY05
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  persistent URL:
  - https://dblp.org/rec/conf/itc/ZorianY05
Yervant Zorian, Avetik Yessayan:
IEEE 1500 utilization in SOC design and test. ITC 2005: 10

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