"On Random Pattern Generation with the Selfish Gene Algorithm for Testing ..."

Junwu Zhang, Michael L. Bushnell, Vishwani D. Agrawal (2004)

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DOI: 10.1109/TEST.2004.1386999

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Junwu Zhang, Michael L. Bushnell, Vishwani D. Agrawal:
On Random Pattern Generation with the Selfish Gene Algorithm for Testing Digital Sequential Circuits. ITC 2004: 617-626

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