"A memory yield improvement scheme combining built-in self-repair and error ..."

Tze-Hsin Wu et al. (2012)

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DOI: 10.1109/TEST.2012.6401576

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  - https://dblp.org/rec/conf/itc/WuCLLWTLCPW12
Tze-Hsin Wu, Po-Yuan Chen, Mincent Lee, Bin-Yen Lin, Cheng-Wen Wu, Chen-Hung Tien, Hung-Chih Lin, Hao Chen, Ching-Nen Peng, Min-Jer Wang:
A memory yield improvement scheme combining built-in self-repair and error correction codes. ITC 2012: 1-9

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