"On pinpoint capture power management in at-speed scan test generation."

Xiaoqing Wen et al. (2012)

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DOI: 10.1109/TEST.2012.6401548

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/WenNMKGTW12
Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang:
On pinpoint capture power management in at-speed scan test generation. ITC 2012: 1-10

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