"Test clock domain optimization for peak power supply noise reduction ..."

Jen-Yang Wen et al. (2011)

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DOI: 10.1109/TEST.2011.6139163

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jen-Yang Wen, Yu-Chuan Huang, Min-Hong Tsai, Kuan-Yu Liao, James Chien-Mo Li, Ming-Tung Chang, Min-Hsiu Tsai, Chih-Mou Tseng, Hung-Chun Li:
Test clock domain optimization for peak power supply noise reduction during scan. ITC 2011: 1-8

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