"Automated system level functional test program generation on ATE from EDA ..."

Motoo Ueda et al. (2012)

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DOI: 10.1109/TEST.2012.6401590

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Motoo Ueda, Shinichi Ishikawa, Masaru Goishi, Satoru Kitagawa, Hiroshi Araki, Shuichi Inage:
Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction. ITC 2012: 1-7

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