"Prediction of Test Pattern Count and Test Data Volume for Scan ..."

Fong-Jyun Tsai et al. (2020)

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DOI: 10.1109/ITC44778.2020.9325219

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-22

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Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada:
Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations. ITC 2020: 1-10

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