"Jitter Generation and Measurement for Test of Multigbps Serial IO."

Sassan Tabatabaei, Michael Lee, Freddy Ben-Zeev (2004)

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DOI: 10.1109/TEST.2004.1387406

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Sassan Tabatabaei, Michael Lee, Freddy Ben-Zeev:
Jitter Generation and Measurement for Test of Multigbps Serial IO. ITC 2004: 1313-1321

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