"Advanced fault model, diagnosis and applications for deep nanometer process."

Youngseok Son et al. (2025)

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DOI: 10.1109/ITC58126.2025.00027

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-22

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  - https://dblp.org/rec/conf/itc/SonCLPZUDS25
Youngseok Son, Muyun Cho, Hyunyul Lim, Jaeseok Park, Piotr Zimnowlodzki, Szczepan Urban, Jayant D'Souza, Manish Sharma:
Advanced fault model, diagnosis and applications for deep nanometer process. ITC 2025: 206-212

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